Contact

The author would be indebted if you send him comments and suggestions on further development of the program. Reports on errors of library data (possibly with the suggested new value) and program bugs are also welcome. Reprints of papers (electronic or printed) referring to XPS MultiQuant are highly appreciated.

• Dr. Miklós Mohai
  Institute of Materials and Environmental Chemistry
  Research Centre for Natural Sciences
  Hungarian Academy of Sciences
  
  

	E-mail:  mohai.miklos@ttk.hu     mohai.miklos@ttk.mta.hu
	ORCID:  0000-0002-5162-1590

If you find the program useful, please refer to the following works of the author (or to other ones, if applicable) in your papers:

• Consideration of Two-dimensional Surface Roughnesses in Quantitative XPS Analysis
  G. Varsányi, G. Mink, K. Rée, M. Mohai, Periodica Polytechnica 31, 3 (1987).
  ISSN 0 324 5853
• Correction for Surface Contaminations in XPS: A Practical Approach
  M. Mohai, I. Bertóti, in: ECASIA 95 (Eds. H. J. Mathieu, B. Reihl, D. Briggs), p. 675, John Willey & Sons, Chichester (1995).
  ISBN 0 471 95899 9
• Calculation of Overlayer Thickness on Curved Surfaces Based on XPS Intensities
  M. Mohai, I. Bertóti, Surf. Interface Anal. 36, 805 (2004).
  [doi:10.1002/sia.1769]
• XPS MultiQuant: Multimodel XPS Quantification Software
  M. Mohai, Surf. Interface Anal. 36, 828 (2004).
  [doi:10.1002/sia.1775]
• XPS MultiQuant: a Step Towards Expert Systems
  M. Mohai, Surf. Interface Anal. 38, 640 (2006).
  [doi:10.1002/sia.2198]
• Calculation of Layer Thickness on Rough Surfaces by Polyhedral Model
  M. Mohai, Surf. Interface Anal. 40, 710 (2008).
  [doi:10.1002/sia.2751]
• Calculation of Layer Thickness on Nanotube Surfaces from XPS Intensity Data
  M. Mohai, I. Bertóti, Surf. Interface Anal. 44, 1130 (2012).
  [doi:10.1002/sia.4864]

If you are interested in the above papers, please request a copy by e-mail.

	Publication list of the author
	PhD Thesis of the author Development and Applications of Quantitative X-ray Photoelectron Spectroscopy