XPS MultiQuant for Windows  version 7.0
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XPS MultiQuant is a quantitative evaluation program for 
X-ray Photoelectron Spectroscopy, serving as a practical 
and universal tool for the surface analyst.


Main features are:
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  Built-in library with all necessary basic data for the quantification, 
  including theoretical and experimental cross sections, asymmetry parameters, 
  line energy data, etc.

  All of the usual factors and correction methods, including cross-section 
  values, asymmetry parameters, analyser transmission, IMFP, contamination 
  by the adventitious carbon can be applied and controlled independently.

  Numerous quantification models (Homogeneous, Oxide-Layer, Layers-on-Plane, 
  Layers-on-Sphere, Layers-on-Cylinder, Layers-on-Polyhedron, Layers-on-Nanotube,
  Islands-on-Plane, Islands-on-Sphere, Islands-on-Cylinder, Islands-on-Polyhedron).

  Calculation for several samples or experimental data sets (e.g., series 
  of ion bombardments or heat treatments, etc.) can be performed simultaneously.
  Layer thickness of the structured models can be calculated either automatically
  or manually.

  Calculation of angle dependent experiment set ("ARXPS").

  Results can be presented in various forms (Atomic %, Atomic ratio, 
  Oxide molar %, Oxide molar ratio, Mass %, Mass ratio, Oxide mass % or 
  Oxide mass ratio) and can be stored, printed and charted.

  Intensity simulation: the integrated photoelectron intensity can be calculated 
  from the composition and layout of the model.

  Reading of 'XPS Reduced Data Echange Files'.

  User-friendly Windows interface, full text online help and comprehensive Manual.


Installation:
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  - Decompress the ZIP archive into an empty folder
  - Run Setup.exe
  - Follow the instructions of the Setup program


Information:
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  Dr. Miklós Mohai
  Web:     http://www.chemres.hu/aki/XMQpages/XMQhome.htm
  E-mail:  mohai@chemres.hu
